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2D Materials for Electronics, Sensors and Devices: Synthesis, Characterization, Fabrication and Application

Objektkategorie:
Elektronische Ressource
Person/Institution:
Verlag:
Elsevier
Veröffentlichungsort:
San Diego
Entstehungszeit:
2022
Umfang, Illustration, Format:
1 online resource (300 pages)
Sprache:
Englisch
Bereitstellende Institution:
Abstract:
Front cover -- Half Title -- Title -- Copyright -- Contents -- Contributors -- Chapter 1 Scalable synthesis of 2D materials -- 1.1 Introduction -- 1.2 Large-area graphene synthesis -- 1.2.1 Top-down: exfoliation and wafer-scale deposition -- 1.2.2 Bottom-up synthesis -- 1.3 Large-area transition metal dichalcogenide synthesis -- 1.3.1 Film conversion -- 1.3.2 Vapor-phase deposition methods -- 1.4 Large-area hexagonal boron nitride synthesis -- 1.4.1 Chemical vapor deposition -- 1.4.2 Molecular beam epitaxy -- Conclusion -- Acknowledgement -- References -- Chapter 2 Synthesis of 2D heterostructures -- 2.1 Introduction -- 2.2 Direct synthesis methods for 2D heterostructures -- 2.2.1 CVD methods and the effect of different precursors -- 2.3 Synthesis of multijunction heterostructures -- 2.3.1 Using the CVD Process -- 2.3.2 MOCVD process -- 2.3.3 Molecular Beam Epitaxy -- 2.4 Vertical heterostructure -- 2.4.1 Graphene and hBN -- 2.4.2 Graphene with TMDs -- 2.4.3 TMD/TMD heterostructures -- 2.4.4 Janus vertical and lateral heterostructure -- 2.5 Phase engineering in lateral heterostructures -- 2.5.1 Phase-selective synthesis -- 2.5.2 Phase transition -- Conclusion -- References -- Chapter 3 Characterization of 2D transition metal dichalcogenides -- 3.1 Introduction -- 3.2 Raman spectroscopy of 2D materials -- 3.3 Raman scattering in TMDs -- 3.3.1 Identifying the number of layers -- 3.3.2 Identifying defects and doping -- 3.3.3 Identifying stacking order in TMDs -- 3.3.4 Measuring interlayer coupling in 2D van der Waals heterostructures (vdWHs) -- 3.3.5 Identifying TMD-based alloys -- 3.3.6 Identifying phase transition -- 3.3.7 Identifying the strain -- 3.4 Photoluminescence spectroscopy -- 3.5 PL in 2D TMDs -- 3.5.1 Identifying the number of layers -- 3.5.2 Identifying defects -- 3.5.3 Identifying doping -- 3.5.4 Identifying strain.
Objekttext:
Description based on publisher supplied metadata and other sources
Universität Erfurt
Forschungsbibliothek Gotha
Schloss Friedenstein
Schlossplatz 1
99867 Gotha
+49 361 737-5540
bibliothek.gotha(at)uni-erfurt.de
Datensatz angelegt am:
2023-04-12
Zuletzt geändert am:
2022-10-18
In Portal übernommen am:
2023-04-12